Acta Metrologica Sinica  2017, Vol. 38 Issue (1): 51-55    DOI: 10.3969/j.issn.1000-1158.2017.01.11
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Measurement uncertainty analysis of CMM in product inspection and conformance testing
CHEN Xiao-huai,JIANG Rui,WANG Han-bin,XU Lei,CHENG Yin-bao,CHENG Zhen-ying
School of Instr Sci & Opto-electronics Engineering, Hefei University of Technology, Hefei, Anhui 230009, China
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