Acta Metrologica Sinica  2011, Vol. 32 Issue (5): 419-423    DOI: 10.3969/j.issn.1000-1158.2011.05.06
Current Issue | Archive | Adv Search |
New Measurement of Omnipotence Tool-Microscope Based on Image Processing
WANG Bo1,NIU Sai-sai2
1.College of Electronics and Information Engineering,Chuzhou University, Chuzhou, Anhui 239000, China
2.College of Mechanical & Electrical Engineering,Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China
Download: PDF (456 KB)   HTML (1 KB) 
Export: BibTeX | EndNote (RIS)      
Abstract  Based on the analysis of the advantages and disadvantages of the traditional omnipotence tool-microscope and modern digital equipment,a new measurement based on image processing is presented.This method combines image measurement technology with grating measurement technology based on FPGA and SCM,and uses AutoCAD secondary development of technology for length,angle,diameter,and other geometric precision measurement of the amount.On the basis of maintained advantages of original equipment such as high precision,strong anti-jamming,long-term stability,wide application and so on,it can improve efficiency and precision of measurement and reduces operation intensity.Compared with the test results of Dual-frequency laser interferometer,it proves that this method has high precision repeatability and measurement accuracy.
Key wordsMetrology      Omnipotence tool-microscope      Grating scale      Image Processing      Sub-pixel     
PACS:  TB92  
Service
E-mail this article
Add to my bookshelf
Add to citation manager
E-mail Alert
RSS
Articles by authors
WANG Bo
NIU Sai-sai
Cite this article:   
WANG Bo,NIU Sai-sai. New Measurement of Omnipotence Tool-Microscope Based on Image Processing[J]. Acta Metrologica Sinica, 2011, 32(5): 419-423.
URL:  
http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2011.05.06     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2011/V32/I5/419
Copyright © Editorial Board of Acta Metrologica Sinica
Supported by:Beijing Magtech