Acta Metrologica Sinica  2011, Vol. 32 Issue (5): 419-423    DOI: 10.3969/j.issn.1000-1158.2011.05.06
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New Measurement of Omnipotence Tool-Microscope Based on Image Processing
WANG Bo1,NIU Sai-sai2
1.College of Electronics and Information Engineering,Chuzhou University, Chuzhou, Anhui 239000, China
2.College of Mechanical & Electrical Engineering,Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China
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