Acta Metrologica Sinica  2011, Vol. 32 Issue (3): 217-220    DOI: 10.3969/j.issn.1000-1158.2011.03.06
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Study on Algorithms of PCB Conductor Top and Bottom Line Widths Measurement
HUANG Yong-lin,YE Yu-tang,CHEN Zhen-long,QIAO Nao-sheng
Opto-electric Information School, University of Electronic Science and Technology, Chendu, Sichuan 610054, China
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Abstract  In order to measure the top and bottom conductor line widths, a fast and accurate edge extraction method is proposed. Common methods of image denoising often lead to blurred edges, especially for heavy-noise contaminated microscopic images. Firstly, P-M model is used to remove noise. This technique can preserves or even enhance prominent edges when removing noise. Canny operator is used to detect the edge in the denoised image. At last, Hough transform is used to detect lines. Experimental results show that the proposed method has strong antinoise capability. The accuracy of line widths measurement is improved. It can be applied to practical engineering measurement system.
Key wordsMetrology      Top and bottom line widths measurement      P-M model      Canny operator      Hough transformation     
PACS:  TB921  
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HUANG Yong-lin
YE Yu-tang
CHEN Zhen-long
QIAO Nao-sheng
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HUANG Yong-lin,YE Yu-tang,CHEN Zhen-long, et al. Study on Algorithms of PCB Conductor Top and Bottom Line Widths Measurement[J]. Acta Metrologica Sinica, 2011, 32(3): 217-220.
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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2011.03.06     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2011/V32/I3/217
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