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| Study on Algorithms of PCB Conductor Top and Bottom Line Widths Measurement |
| HUANG Yong-lin,YE Yu-tang,CHEN Zhen-long,QIAO Nao-sheng |
| Opto-electric Information School, University of Electronic Science and Technology, Chendu, Sichuan 610054, China |
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Abstract In order to measure the top and bottom conductor line widths, a fast and accurate edge extraction method is proposed. Common methods of image denoising often lead to blurred edges, especially for heavy-noise contaminated microscopic images. Firstly, P-M model is used to remove noise. This technique can preserves or even enhance prominent edges when removing noise. Canny operator is used to detect the edge in the denoised image. At last, Hough transform is used to detect lines. Experimental results show that the proposed method has strong antinoise capability. The accuracy of line widths measurement is improved. It can be applied to practical engineering measurement system.
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2011, Vol. 32 
