| ［1］Rainer F,Dickson R K,Jennings R T,et al.Development of Practical Damage-Mapping and Inspection Systems［C］//The Third Annual International Conference on SSLA to ICF,Monterey,USA:1999,556-563.
［2］杨甬英,陆春华,梁蛟,等.光学元件表面缺陷的显微散射暗场成像及数字化评价系统［J］.光学学报,2007,27(6):1031-1038.
［3］Burnham A K,Hackel L A,Wegner P J,et al.Improving 351-nm Damage Performance of Large-aperture Fused Silica and DKDP Optics［R］.UCRL-JC-144298,2002．
［4］戴名奎,徐德衍.光学元件的疵病检验与研究现状［J］.光学仪器,1996,18(3):33～39.
［5］王宏涛,何晓波,陈琪.形状尺寸自动检测系统的设计［J］.计量学报,2011,32(3):221-226.
［6］米曾真.基于数字图像处理技术的光学元件表面缺陷检测与分析［D］.重庆:重庆大学,2009.
［7］范勇,陈念年,高玲玲,等.大口径精密表面疵病的数字化检测系统［J］.强激光与粒子束,2009,21(7):1032-1036.
［8］中宁馨,彭承琳,王翊,等.基于图像的颗粒物检测研究［J］.计算机测量与控制,2009,17(1):14-17. |
2012, Vol. 33 
