Acta Metrologica Sinica  2013, Vol. 34 Issue (3): 221-215    DOI: 10.3969/j.issn.1000-1158.2013.03.05
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Accurately Following Measuring Technique for Warpage of Substrate Glass
SHAO Wei1,GUO Jun-jie2,CHANG Ting1,LIU Chong1
1.Xi’an University of Technology, Xi’an, Shaanxi 710048, China;
2.Xi’an Jiaotong University, Xi’an, Shaanxi 710049, China
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