Acta Metrologica Sinica  2013, Vol. 34 Issue (3): 221-215    DOI: 10.3969/j.issn.1000-1158.2013.03.05
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Accurately Following Measuring Technique for Warpage of Substrate Glass
SHAO Wei1,GUO Jun-jie2,CHANG Ting1,LIU Chong1
1.Xi’an University of Technology, Xi’an, Shaanxi 710048, China;
2.Xi’an Jiaotong University, Xi’an, Shaanxi 710049, China
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Abstract  For measuring warpage of large size substrate glass,a generalized minimum variance principle base on real-time adjusting polynomial weights (RAPW_GMV) automatic scanning method is introduced.Its main idea is based on the real-time estimation of the parameters of controlled object and RAPW_GMV output to correction polynomial weights to fulfill the automatic tracking measuring of probe.The experimental results confirm the tracking error of automatic measuring of unknown surface is superior to 0.02mm, and  the automatic measuring of substrate glass warpage  with fast and high precision is realized.
Key wordsMetrology      Warpage      Following scanning      RAPW_GMV control      Real-time adjusting     
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SHAO Wei
GUO Jun-jie
CHANG Ting
LIU Chong
Cite this article:   
SHAO Wei,GUO Jun-jie,CHANG Ting, et al. Accurately Following Measuring Technique for Warpage of Substrate Glass[J]. Acta Metrologica Sinica, 2013, 34(3): 221-215.
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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2013.03.05     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2013/V34/I3/221
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