Acta Metrologica Sinica  2024, Vol. 45 Issue (2): 222-230    DOI: 10.3969/j.issn.1000-1158.2024.02.12
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Sensitivity Field Optimization Method for Coplanar Array Electrodes
WEN Yingtang,WANG Kai,ZHANG Yuyan,ZONG Lewen,PAN Zhao
School of Electrical engineering, Yanshan University, Qinhuangdao, Hebei 066004, China
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Abstract  In order to improve the imaging quality and stability of the coplanar 3×4 array capacitive imaging system, a method of data dimensionality reduction combined with square sensitivity enhancement is proposed to optimize the sensitive field. The method is based on the principle of maximum entropy to realize the adaptive dimensionality reduction and optimization of the sensitive field, and the reconstructed feature sensitive field has higher feature matching with the actual sensitive field. In addition, the squared sensitivity enhancement method can enhance the contrast between the sensitive field feature data and the non-feature data, and can also attenuate the feature edge volatility caused by the sensitive field vector solution. Finally, the effectiveness of the proposed optimization method is verified by designing several sets of experiments with a coplanar 3×4 array capacitive imaging system, and the results show that the quality and stability of the reconstructed images are significantly improved after the sensitive field optimization.
Key wordsnon-destructive testing;electric capacitance imaging      coplanar array capacitance      sensitive field      image reconstruction     
Received: 11 August 2022      Published: 21 February 2024
PACS:  TB937  
Fund:S&T Program of Hebei;S&T Program of Hebei;Natural Science Foundation of Hebei Province
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WEN Yingtang
WANG Kai
ZHANG Yuyan
ZONG Lewen
PAN Zhao
Cite this article:   
WEN Yingtang,WANG Kai,ZHANG Yuyan, et al. Sensitivity Field Optimization Method for Coplanar Array Electrodes[J]. Acta Metrologica Sinica, 2024, 45(2): 222-230.
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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2024.02.12     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2024/V45/I2/222
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