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Influence of Sample Temperature Field of Double Infrared Laser Temperature Calibration Source on Measurement Results |
GU Qing-tao1,WANG Xin-yu1,AN Bao-lin2,ZHAI Hui-xing1,DONG-Wei2,WANG Rui-xiang1 |
1. Beijing Engineering Research Center of Sustainable Energy and Buildings, Beijing University of Civil Engineering and Architecture, Beijing 100044, China
2. National Institute of Metrology, Beijing 100029, China |
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Abstract Active dual-wavelength infrared laser temperature measurement can realize emissivity free temperature measurement. The instrumental constant is the core parameter of the temperature measuring system. At present, the determination of the instrumental constant depends on the temperature of the center point on the surface of the calibration sample. In the process of temperature measurement and calibration, when the detection position of the surface of the calibration sample deviates from its central point, the result of the instrument constant will be affected. But the temperature field distribution outside the central point and its influence on the temperature measurement results are scarce. Therefore, The numerical modeling of the calibration samples is carried out to analyze the distribution of temperature fields of different samples and their influence on the measurement results. The results show that the temperature distribution on the front surface of the sample is approximately center-symmetric. The center temperature is low and the edge temperature is high. The temperature from the center to the edge increases rapidly first and then slowly with the direction of the radius. The influence of different deviation degree of calibration sample position on the instrumental constant is analyzed. When the calibration temperature is 1173K and the calibration position offset is ±5mm, the effects of the calibrated instrumental constants of superalloy, low emissivity coating sample and SiC are 1.87%, 1.06% and 0.79%, respectively. The influence of the instrumental constant on the temperature measurement results is further analyzed. The mean relative deviations of the superalloy, low emissivity coating sample and SiC due to the instrumental constant deviation are 0.34%, 0.20% and 0.14%, respectively, in the temperature measurement range of 873~1073K.
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Received: 12 October 2022
Published: 18 May 2023
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