X射线衍射法测量电容传声器的膜片张力

doi:10.3969/j.issn.1000-1158.2022.12.20

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Abstract To realize the direct measurement of the diaphragm tension of condenser microphones, the X-ray diffraction technology is adopted to measure microphone diaphragm with different tension. Comparing with the calculated tension value of the electrostatic excitation resonance method, the results show that two methods had the same trend and good consistency about the tension of microphone diaphragm. The resonant frequency calculated by the microphone frequency response includes the influence of the back cavity of the condenser microphone. Therefore, its measured value is slightly higher than the resonant frequency of the diaphragm itself. Therefore, the measured result of the X-ray diffraction method is slightly lower than the tension value calculated according to the resonant frequency. Finally, the influence of diaphragm tension on the electroacoustic characteristics of condenser microphone is verified by a series of tests.

Key words： metrology condenser microphone;diaphragm stress X-ray diffraction;frequency response

Received: 03 December 2021 Published: 28 December 2022

PACS:

TB95

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	Articles by authors
	LI Xu
	HE Long-biao
	ZHU Hai-jiang
	ZHANG Xiao-li
	FENG Xiu-juan
	NIU Feng

Cite this article:

LI Xu,HE Long-biao,ZHU Hai-jiang, et al. Measurement of Diaphragm Tension of Condenser Microphone by X-ray Diffraction[J]. Acta Metrologica Sinica, 2022, 43(12): 1645-1650.

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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2022.12.20 OR http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2022/V43/I12/1645

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