Acta Metrologica Sinica  2022, Vol. 43 Issue (6): 811-817    DOI: 10.3969/j.issn.1000-1158.2022.06.16
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Simulation of X-ray Machine and Correction of Heel Effect Based on MCNP
YAN Yong-qiang1,3,WU Jin-jie3,JIN Shang-zhong1,2,ZHAO Rui3
1. School of Optical and Electronic Technology, China Jiliang University, Hangzhou, Zhejiang 310018, China
2. Key Laboratory of Zhejiang Province on Modern Measurement Technology and Instrument,  Hangzhou, Zhejiang 310018, China; 3. National Institute of Metrology, Beijing 100029, China
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