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| Blind Reconstruction Method of AFM Image Based on Conditional Generative Adversarial Network |
| HU Jia-cheng1,YAN Di-xin1,CAO Cong2,SHI Yu-shu3,ZHANG Shu3,LI Dong-sheng1 |
1. University of China Jiliang, Hangzhou,Zhejiang 310018,China
2. Shandong Institute of Metrology,Jinan,Shandong 250014,China
3. National Institute of Metrology,Beijing 100029,China |
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Abstract To solve the problem caused by the tip broadening effect in the imaging process of atomic force microscope(AFM), a blind reconstruction method of AFM image based on the condition generating adversarial network (CGAN) is proposed.First, on the basis of pix2pixHD network, the simulation sample data are trained by global generation network, and AFM measurement data are trained by local lifting network. Finally, feature matching loss function is used to improve the lateral resolution of grid edge.The experimental results show that when performing the blind reconstruction for the measurement image of the one-dimensional rectangular grid with line width being 8μm under AFM, the standard deviation of the reconstructed image is 0.33×0.45μm, which has a high imaging resolution and is conducive to improving the accuracy of the measurement of the AFM image one-dimensional grid.
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Received: 17 February 2020
Published: 24 May 2021
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| Fund:;National Natural Science Foundation of China |
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2021, Vol. 42 
