Acta Metrologica Sinica  2021, Vol. 42 Issue (3): 370-374    DOI: 10.3969/j.issn.1000-1158.2021.03.18
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Research on Lead Equivalent Measurement of Narrow X-ray Beam Shielding Material
HAN Lu1,2,ZHAO Rui2,WU Jin-jie2,LU Chun-hai1,WEN Yu-qin1,2,YAN Yong-qiang2,3
1. Chengdu University of Technology, Chengdu, Sichuan 610059, China
2. National Institute of Metrology, Beijing 100029, China
3. China Jiliang University, Hangzhou, Zhejiang 310018, China
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