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| Study on active dual-wavelength infrared laser thermometry calibration experiments |
| QU Yan1,HUAN Ke-wei1,AN Bao-lin2,DONG Wei2,ZHAO Yun-long2,SONG Xu-yao1,YUAN Zun-dong2 |
1. Changchun University of Science and Technology, Changchun, Jilin 130022, China
2. National Institute of Metrology, Beijing 100029, China |
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Abstract Based on active dual-wavelength infrared laser thermometry method, it is possible to measure the true surface temperature when the emissivity is unknown. A high-precision calibration source is an important basis for the accuracy of dual-wavelength infrared thermometry system. However, there is a lack of public reports on such calibration sources in the current research work in the field of dual-wavelength temperature measurement. Therefore, an active infrared laser temperature measuring source is designed and built to study the stability and uniformity of the calibration source, and the dual-wavelength laser thermometry system is calibrated. The results show that the active dual-wavelength infrared laser temperature calibration source has good stability, and the maximum temperature deviation within 20 minutes at 1173K is 0.22K; the surface temperature uniformity is well, and the standard deviation of the surface temperature at 1173K is 0.34K. When the true temperature of the source surface is above 923K, the relative standard deviation of the collected signal is less than 0.7%. The calibration experiment results show that the calibration source has good reliability for the accurate calibration of the active dual-wavelength infrared laser temperature measurement system.
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Received: 30 October 2020
Published: 18 February 2021
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2021, Vol. 42 
