Acta Metrologica Sinica  2020, Vol. 41 Issue (5): 529-537    DOI: 10.3969/j.issn.1000-1158.2020.05.04
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Accurate Measurement of Nanoparticles By Using Multi-angle Dynamic Light Scattering
SUN Miao1,2,HUANG Lu1,GAO Si-tian1,WANG Zhi1,2,DONG Ming-Li2
1. National Institute of Metrology, Beijing 100029, China
2. Instrument Science and Optoelectronic Engineering College, Beijing Information Science and Technology University, Beijing 100192, China
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