基于FCM优化的平面阵列电容成像算法

doi:10.3969/j.issn.1000-1158.2020.02.18

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Abstract In order to improve the accuracy of planar array capacitance imaging, an imaging algorithm based on fuzzy C-means algorithm(FCM) data optimization is proposed. According to the characteristics of capacitance data of planar array electrodes, in order to reduce the influence of capacitance measurement error on dielectric constant, application of FCM algorithm to the continuous convergence of measured capacitance to achieve data optimization. On this basis, a defect detection experiment was carried out on a kind of insulating material adhesive layer, and the image correlation coefficient of the reconstructed image was improved, and the image reconstruction error was reduced. The experimental results show that the proposed optimization algorithm can obtain more stable and effective capacitance data, and the reconstruction accuracy of glue layer defect image has been greatly improved.

Key words： metrology insulation composite reconstruction of glue layer defect image FCM planar array sensor electrical capacitance tomography

Received: 25 September 2018 Published: 17 February 2020

PACS:	TB971
	TP212.1

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	Articles by authors
	WEN Yin-tang
	CAO Peng-peng
	TIAN Hong-gang
	ZHANG Yu-yan
	LUO Xiao-yuan

Cite this article:

WEN Yin-tang,CAO Peng-peng,TIAN Hong-gang, et al. An Optimized Planar Array Capacitance Imaging Algorithm Based on FCM[J]. Acta Metrologica Sinica, 2020, 41(2): 231-237.

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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2020.02.18 OR http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2020/V41/I2/231

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