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Analysis on a New Free-space Technology for the Measurement of Complex Permittivity |
FANG Wei-Hai, NIAN Feng, CHEN Yun-Mei |
Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Radio Metrology & Measurements, Beijing 100039, China |
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Abstract A new free-space measurement for the complex permittivity is proposed.In this method,dielectric periodic structure (DPS) is introduced to the measurement of complex permittivity for the first time.The scattering characteristics of DPS added lossy sample layer are systemically analyzed by a method which combines the multimode network theory with the rigorous mode matching method.The effects of sample complex permittivity on the amplitudes and center frequencies of the maximum reflections are analyzed in details.The method not only overcomes the instability problem and phase-shift ambiguity which exist in the traditional free-space measurement,but also possesses the merit of cavity measurement technique which can accurately determine the complex permittivity of low lossy materials with simple measurement process.The research provides a new method and important theoretical guidelines for the accurate measurement of complex permittivity.
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[1] Santra M, Limaye K U. Estimation of complex 〖HJ2.05mm〗permittivity of arbitrary shape and size dielectric samples using cavity measurement technique at microwave frequency[J]. IEEE Transactions on Microwave Theory and Techniques, 2005,53(2):718-721.
[2] 王守军,胡乐乐,徐得名.测量多层薄膜材料复介电系数的准光腔技术[J].电子学报,1998,26(5):30-33.
[3] Suzuki H, Kamijio T. Millimeter-wave measurement of complex permittivity by perturbation method using open resonator [J]. IEEE Transactions on Instrumentation and Measurement,2008,57(12):2868-2873.
[4] Nishikata A. A swept-frequency measurement of complex permittivity and complex permeability of a columnar specimen inserted in a rectangular waveguide[J].IEEE Transactions on Microwave Theory and Techniques,2007,55 (7):1554-1567.
[5] Mohammd A S,Sedki M R,Aicha E.Wide-band measurement of the complex permittivity of dielectric materials using a wide-band cavity[J].IEEE Transactions on Instrumentation and Measurement,1989,38(2):488-495.
[6] Eddine N,Tahar B,Lamer A F.Broadband simultaneous measurement of the complex permittivity tensor uniaxial materials using a coaxial discontinuity[J].IEEE Transactions on Microwave Theory and Techniques,1991,39(10):1781-1724.
[7] Ghodgaonkar D K,Vardan V V,Vardan V K.Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies[J].IEEE Transactions on Instrumentation and Measurement,1990,39(2):387-394.
[8] Vardan V V, Hollinger R D, Ghodgaonkar D K, et al. Free-space, braodband measurements of high-temperature, complex dielectric properties at microwave frequencies[J]. IEEE Transactions on Instrumentation and Measurement, 1991,40(5): 842-846.
[9] Peng S T. Rigorous formulation of scattering and guidance by dielectric grating waveguides: general case of oblique incidence[J].J Opt Soc Am A,1989,6(12):1869-1883.
[10] 方维海, 徐善驾.介质损耗对左手媒质周期结构频率选择特性的影响[J].电子学报,2007,35(12):2399-2402.
[11] Sorin T, Robert M, Theresa A M, et al. Dielectric frequency-selective structures incorporating waveguide gratings[J]. IEEE Transactions on Microwave Theory and Techniques, 2000, 48(4):553-561. |
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