热反射测温中基于随机共振的微小信号测量

doi:10.3969/j.issn.1000-1158.2019.04.12

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Abstract A method of using stochastic resonance to improve the temperature resolution of CCD based thermoreflectance was proposed. A specific quantization rule of CCD detector was supposed, the principles of stochastic resonance work on the nonlinearly CCD detector were analyzed, the measurement results by CCD detector after applying stochastic resonance were calculated in theory. A simulation program based on LabVIEW was developed to simulate the effects of kinds of stochastic noise on measuring weak signals, and the simulation results were consistent with the calculation ones. The simulation also showed that the weaker the noise intensity is, the lager the errors is, when the noise intensity was more than 1, the simulation results were nearly equal to the accurate ones. A thermoreflectance apparatus with a theoretical resolution 1.035℃ was installed, a 0.5℃ weak signal was measured, the results were between 0.455~0.673℃, it is confirmed that stochastic resonance can improve the weak signal measurement capability of CCD detector.

Key words： metrology thermoreflectance temperature measurment stochastic resonance CCD detector weak signal

Received: 22 May 2018 Published: 10 June 2019

PACS:	TB942
	TB973

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	Articles by authors
	ZHAI Yu-wei
	ZHENG Shi-qi
	LIU Yan
	LI Ying-hui
	LIANG Fa-guo

Cite this article:

ZHAI Yu-wei,ZHENG Shi-qi,LIU Yan, et al. Weak Signal Measurement in Thermoreflectance Temperature Testing Based on Stochastic Resonance[J]. Acta Metrologica Sinica, 2019, 40(4): 618-624.

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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2019.04.12 OR http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2019/V40/I4/618

［1］李兴慧, 张光明, 阴俊霞, 等. 基于S变换的自适应降噪方法［J］. 兰州理工大学学报, 2013, 39(2): 21-24.
Li X H, Zhang G M, Yin J X, et al. Adaptive noise reduction method based on S transform ［J］. Journal of Lanzhou University of Technology, 2013, 39(2): 21-24.
［2］Benzi R, Sutera A, Vulpiani A. The mechanism of stochastic resonance ［J］. Journal of Physics A: Mathematical ＆ General, 1981, 14: L453-L457.
［3］梁军利, 杨树元, 唐志峰. 基于随机共振的微弱信号检测［J］.电子与信息学报,2006, 28(6): 1068-1072.
Liang J L, Yang S Y, Tang Z F. Weak Signal Detection Based on Stochastic Resonance ［J］. Journal of Electronics & Information Technology, 2006, 28(6): 1068-1072.
［4］Gammaitoni L, Hnggi P, Jung P, et al. Stochastic Resonance［J］. Reviews of Modern Physics, 1998, 70(1): 223-287.
［5］冷永刚, 王太勇. 二次采样用于随机共振从强噪声中提取弱信号的数值研究［J］. 物理学报, 2003, 52(10): 2432-2437.
Leng Y G, Wang T Y. Numerical research of twice sampling stochastic resonance for the detection of a weak signal submerged in a heavy noise ［J］. Acta Physica Sinica, 2003, 52(10): 2432-2437.
［6］周玉荣, 郭锋, 蒋世奇, 等. 信号调制色噪声作用下线性系统的随机共振［J］. 计量学报, 2008, 29(4): 369-373.
Zhou Y R, Guo F, Jiang S Q, et al. Stochastic Resonance of a Linear System Subject to Signal Modulated Colored Noise ［J］. Acta Metrologica Sinica, 2008, 29(4): 369-373.
［7］蒋行国, 许金海, 张龙. 基于随机共振的惯性传感器信号实时处理方法［J］. 系统工程与电子技术, 2014, 36(11): 2280-2287.
Jiang X G, Xu J H, Zhang L. Real-time processing method based on stochastic resonance for inertial sensors signals ［J］. System Engineering and Electronics, 2014, 36(11): 2280-2287.
［8］缑新科, 马艳. 基于随机共振的混合频率微弱信号检测［J］. 兰州理工大学学报, 2016, 42(2): 97-100.
Gou X K, Ma Y. Detection of mixed-frequency weak signal based on stochastic resonance ［J］. Journal of Lanzhou University of Technology, 2016, 42(2): 97-100.
［9］王友国,翟其清,刘健.统计信号处理中的随机共振研究进展［J］. 南京邮电大学学报, 2016, 36(5):10-17.
Wang Y G, Zhai Q Q, Liu J. Advances in stochastic resonance in statistical signal processing ［J］. Journal of Nanjing University of Posts and Telecommunications, 2016, 36(5): 10-17.
［10］郝静, 杜太行, 杨梅, 等. 基于LabVIEW的随机共振高频微弱信号检测系统［J］. 仪表技术与传感器, 2017, (10): 62-66.
Hao J, Du T H, Yang M, et al. Detection System of Weak Signal in High Frequency Based on Stochastic Resonance with LabVIEW ［J］. Instrument Technique and Sensor, 2017, (10): 62-66.
［11］时培明, 苏翠娇, 赵娜, 等. 基于AMD和自适应随机共振的旋转机械故障诊断方法研究［J］. 计量学报, 2017, 38(1): 112-116.
Shi P M, Su C J, Zhao N, et al. Study on Fault Diagnosis Method for Rotating Machinery Based on Adaptive Stochastic Resonance and AMD ［J］. Acta Metrologica Sinica, 2017, 38(1): 112-116.
［12］李继猛, 张云刚, 张金凤, 等. 基于自适应随机共振的齿轮微弱冲击故障信号增强提取方法的研究［J］. 计量学报, 2017, 38(5): 602-606.
Li J M, Zhang Y G, Zhang J F, et al. Enhancement and Extraction of Gear Weak Impact Fault Signal Based on an Adaptive Stochastic Resonance ［J］. Acta Metrologica Sinica, 2017, 38(5): 602-606.
［13］时培明, 孙鹏, 袁丹真. 基于非线性耦合双稳态随机共振的轴承微弱故障信号增强检测方法研究［J］. 计量学报, 2018, 39(3): 373-376.
Shi P M, Sun P, Yuan D Z. Research on the Enhanced Detection Method of Bearing Fault Weak Fault Signal Based on Nonlinear Coupled Bistable Stochastic Resonance ［J］. Acta Metrologica Sinica, 2018, 39(3): 373-376.
［14］Lüeren D, Hudgings J A, Mayer P M, et al. Nanoscale thermo-reflectance microscopy with 10mK temperature resolution using stochastic resonance ［C］ // 21st Annual IEEE SEMITHERM Symp. San Jose, CA, 2005: 253-8.
［15］Farzaneh M, Maize K, Lüeren D, et al. CCD-based thermoreflectance microscopy: Principles and applications ［J］. Journal of Physics: D, 2009, 42(14): 1-20.
［16］Komarov P L, Burzo M G, Raad P E. A Thermoreflectance Thermography System for Measuring the Transient Surface Temperature Field of Activated Electronic Devices ［C］ // 22nd IEEE SEMITHERM Symp. Dallas, TX, USA, 2006: 199-204.
［17］翟玉卫, 梁法国, 吴爱华. 亚微米量级空间分辨力的光反射热成像技术的原理及应用［J］. 现代科学仪器, 2014, (6): 44-48.
Zhai Y W, Liang F G, Wu A H. The principles of thermoreflectance imaging technology with sub-micro scale space resolution and its applications ［J］. Modern Scientific Instruments, 2014, (6): 44-48.
［18］Mayer P M, Lüeren D, Ram R J, et al. Theoretical and experimental investigation of the resolution and dynamic range of CCD-based thermoreflectance imaging ［J］. J Opt Soc Am A Opt Image Sci Vis, 2007, 24(4): 1156-63.
［19］Sarua A, Hangfeng J, Kuball M, et al. Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures ［J］. IEEE Transactions on Electron Devices, 2006, 53(10): 2438-2447.
［20］Maize K, Pavlidis G, Heller E, et al. High resolution and thermal characterization and simulation of power AlGaN/GaN HEMTs using micro-Raman thermography and 800 picosecond transient thermoreflectance imaging ［C］ // Proceedings of Compound Semiconductor Integrated Circuit Symposium. La Jolla, CA, USA, 2014: 1-8.
［21］Maize K, Heller E, Shakouti A, et al. Fast transient thermoreflectance CCD imaging of pulsed self-heating in AlGaN/GaN power transistors ［C］ // Proceedings of IEEE International Reliability Physics Symposium. Anaheim, CA, USA, 2013: CD.2.1-CD.2.3.
［22］Ling J H L, Tay A A O. Measurement of LED junction temperature using thermoreflectance thermography［C］ // 15th International Conference on Electronic Packaging Technology. Chengdu, China, 2014: 1482-1484.
［23］翟玉卫, 梁法国, 郑世棋, 等. 用热反射测温技术测量GaN HEMT的瞬态温度［J］. 半导体技术, 2016, 41(1): 43-47.
Zhai Y W, Liang F G, Zheng S Q, et al. Transient Temperature Measurement of GaN HEMT Using ThermoreflectanceTechnique ［J］. Semiconductor technology, 2016, 41(1): 43-47.