Acta Metrologica Sinica  2019, Vol. 40 Issue (2): 208-212    DOI: 10.3969/j.issn.1000-1158.2019.02.06
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Absolute Test of Optical Planar by Closed Loop
ZHANG Ling-hua1,3,HAN Sen2,3,4,WU Quan-ying1,TANG Shou-hong2,3,LI Xue-yuan3,4,WANG Quan-zhao4
1. Suzhou University of Science and Technology, Suzhou, Jiangsu 215009, China
2. University of Shanghai for Science and Technology, Shanghai 200093, China
3. Suzhou H&L Instruments LLC, Suzhou, Jiangsu 215123, China
4. Suzhou W&N Instruments LLC, Suzhou, Jiangsu 215123, China
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