Acta Metrologica Sinica  2018, Vol. 39 Issue (4): 531-535    DOI: 10.3969/j.issn.1000-1158.2018.04.17
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Method of Setting Empty/Full Field for Coplanar Capacitance Array Imaging Sensor
ZHANG Yu-yan1,SUN Dong-tao1,ZHANG Zhen-da1,WEN Yin-tang2
1. Key Lab of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, Hebei 066004, China
2. Institute of Defense Science and Technology,Yanshan University, Qinhuangdao, Hebei 066004, China
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Abstract  Using a conventional single dielectric medium as empty or full field often leads to the low measurement accuracy when the planar array electrode capacitance imaging technology is applied to nondestructive testing of defects, because electrodes are arranged in the same plane. A method of setting the relative empty/full field using air and tested material as dielectric is proposed. The capacitance value of empty/full field is adjustable and non-unique by changing the spatial position and size of the two kinds of medium, respectively. The working principle of the planar array capacitance sensor is described and the sensitivity matrix is obtained by means of finite element simulation for measure field made up of heat insulating material and epoxy resin. Experimental study on capacitance imaging is conducted for empty and full field setting method. The results show that the imaging quality can be improved, the plane position information of defects in the object is given, and the validity of the method is verified.
Key wordsmetrology      electric capacitance imaging      planar array electrode      nondestructive testing      finite element     
Received: 12 October 2016      Published: 06 July 2018
PACS:  TB937  
Corresponding Authors: Yu-yan ZHANG     E-mail: yyzhang@ysu.edu.cn
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ZHANG Yu-yan
SUN Dong-tao
ZHANG Zhen-da
WEN Yin-tang
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ZHANG Yu-yan,SUN Dong-tao,ZHANG Zhen-da, et al. Method of Setting Empty/Full Field for Coplanar Capacitance Array Imaging Sensor[J]. Acta Metrologica Sinica, 2018, 39(4): 531-535.
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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2018.04.17     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2018/V39/I4/531
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