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| Research on Calibration Method Key Parameters of EL Infrared Defect Tester |
| ZHANG Ke-jia1,ZHANG Bi-feng2,XIONG Li-min2,ZHOU Tao-geng1,ZHANG Jun-chao2,MENG Hai-feng2,CAI Chuan2,HE Ying-wei2,LI Xiao-hui1,WANG Chang-shi1 |
1.北京理工大学 光电学院 光学测量实验室, 北京 100081
2.中国计量科学研究院, 北京 100029 |
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Abstract Based on the spatial frequency response(SFR) test method, a calibration device for the critical parameters of the EL infrared defect tester was built.The effects of focusing and position placement on the resolution calibration are analyzed.For the portable and fixed EL tester, the corresponding test methods and operational procedures are given.A test method for portable EL tester is proposed, which can realize the calibration without reference background.Based on the above calibration device, the resolution parameters of various EL testers can be calibrated and the measurement results are reproducible.
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Received: 25 April 2017
Published: 11 February 2018
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2018, Vol. 39 
